High-resolution Si 3 N 4 spectrometer: architecture & virtual channel synthesis and experimental demonstration.

Up-to-date network telemetry is the key enabler for resource optimization by capacity scaling, fault recovery, and network reconfiguration among other means. Reliable optical performance monitoring in general and, specifically, the monitoring of the spectral profile of WDM signals in fixed- and flex- grid architectures across the entire C-band, remains challenging. This article describes a two-stage spectrometer architecture amenable to integration on a single chip that can measure quantitatively the spectrum across the entire C-band with a resolution of ∼ 1.4 GHz. The first stage consists of a ring resonator with intra-ring phase shifter to provide a tuneable fine filter. The second stage makes use of an AWG subsystem and a novel processing algorithm to synthesize a tuneable coarse filter with a flat passband which isolates individual resonances of a multiplicity of ring resonances. The spectrometer is capable of scanning the entire C-band with high resolution using only one dynamic control. Due to its maturity and low loss, CMOS compatible Si3 N4 is chosen for fabrication of the ring resonator and two cyclic AWGs. Complete spectrometer operation is demonstrated experimentally over a selected portion of the C-band. A novel virtual channel synthesis algorithm based on the weighted summation of the AWG output port powers relaxes the conventional AWG design requirement of a flat passband and sharp transition to stopband. The operation of the circuit is invariant to the optical path length between individual components and the algorithm corrects to some extent fabrication process variation impairments of the AWG channel spectra substantially improving robustness.