A Study of the Wettability of Single-Walled Carbon Nanotube Films on Flat and Textured Si Substrates.

Contact angle measurements are investigated on the surface of single-walled carbon nanotube (SWNT) films directly formed on flat and textured Si substrates using a thermal chemical vapor deposition method. The SWNT films on the textured Si consist of a multiscale structure composed of nanoscale SWNTs and a microscale textured Si. They show superhydrophobic properties in which the water contact angle was around 161°. A direct surface treatment to them increase the contact angle to 174°. The reversible wettability of the SWNT films formed on the textured Si substrates is confirmed through the oxidation process using an acid mixture of nitric and sulfuric acids and a successive reduction procedure via heating treatment in an NH₃ environment.