Add like
Add dislike
Add to saved papers

Mechanical Property of SAC305 Ball-Grid Array and Epoxy Sn-58Bi Solder Joints with 85 °C/85% Relative Humidity Environmental Conditions.

The ball-grid array (BGA) is widely used to reduce component size and it had advantages such as high I/O pins and fine pitch. Typical Sn-Ag-Cu (SAC) solder alloys are used for formation of BGA because SAC solder has excellent characteristics among lead-free solders. However, the electronic components assembled by SAC solder were easily damaged by heat during manufacture process because SAC solder had high melting point of 220 °C. To prevent these thermal damages, SAC305 BGA component assembled by Sn-58Bi solder paste has been studied because Sn-58Bi solder had low melting point of 139 °C. In generally, Sn-58Bi solder was improved by additional elements or polymer such as epoxy because Sn-58Bi had a brittle property. However, the epoxy Sn-58Bi solder did not guaranteed high environmental reliability such as high-temperature high-humidity (HTHH) test. Thus, we evaluated the shear strength of solder joints assembled by SAC305 BGA components with Sn-58Bi solder paste and epoxy Sn-58Bi solder paste. The shear strength of solder joints was evaluated by die shear test after HTHH test at the 85 °C/85% RH conditions. The Cu6Sn5 intermetallic-compound (IMC) at the interface of solder joints was observed by scanning electron microscope (SEM). The IMC thickness of Sn-58Bi solder joints was smaller than that of epoxy Sn-58Bi solder. The shear strength was improved up to 20% by epoxy addition. The shear strength of epoxy Sn-58Bi solder joints dramatically decreased after HTHH test for 100 h.

Full text links

We have located links that may give you full text access.
Can't access the paper?
Try logging in through your university/institutional subscription. For a smoother one-click institutional access experience, please use our mobile app.

Related Resources

For the best experience, use the Read mobile app

Mobile app image

Get seemless 1-tap access through your institution/university

For the best experience, use the Read mobile app

All material on this website is protected by copyright, Copyright © 1994-2024 by WebMD LLC.
This website also contains material copyrighted by 3rd parties.

By using this service, you agree to our terms of use and privacy policy.

Your Privacy Choices Toggle icon

You can now claim free CME credits for this literature searchClaim now

Get seemless 1-tap access through your institution/university

For the best experience, use the Read mobile app