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JOURNAL ARTICLE
RESEARCH SUPPORT, NON-U.S. GOV'T
High-Throughput Structural and Functional Characterization of the Thin Film Materials System Ni-Co-Al.
ACS Combinatorial Science 2017 October 10
High-throughput methods were used to investigate a Ni-Co-Al thin film materials library, which is of interest for structural and functional applications (superalloys, shape memory alloys). X-ray diffraction (XRD) measurements were performed to identify the phase regions of the Ni-Co-Al system in its state after annealing at 600 °C. Optical, electrical, and magneto-optical measurements were performed to map functional properties and confirm XRD results. All results and literature data were used to propose a ternary thin film phase diagram of the Ni-Co-Al thin film system.
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