The effect of self-depleting in UV photodetector based on simultaneously fabricated TiO 2 /NiO pn heterojunction and Ni/Au composite electrode.

A novel dark self-depleting ultraviolet (UV) photodetector based on a TiO2 /NiO pn heterojunction was demonstrated and exhibited lower dark current (I dark ) and noise. Both the NiO layer and Ni/Au composite electrode were fabricated by a smart, one-step oxidation method which was first employed in the fabrication of the UV photodetector. In dark, the depleted pn heterojunction structure effectively reduced the majority carrier density in TiO2 /NiO films, demonstrating a high resistance state and contributing to a lower I dark of 0.033 nA, two orders of magnitude lower than that of the single-material devices. Under UV illumination, the interface self-depleting effect arising from the dissociation and accumulation of photogenerated carriers was eliminated, ensuring loss-free responsivity (R) and a remarkable specific detectivity (D*) of 1.56 × 1014 cm Hz1/2 W-1 for the optimal device. The device with the structure of ITO/TiO2 /NiO/Au was measured to prove the mechanisms of interface self-depleting in dark and elimination of the depletion layer under UV illumination. Meanwhile, shortened decay time was achieved in the pn heterojunction UV photodetector. This suggests that the self-depleting devices possess the potential to further enhance photodetection performance.