Fatigue Failure of Narrow Implants with Different Implant-Abutment Connection Designs.

PURPOSE: To evaluate the reliability of narrow diameter dental implants (NDIs) with similar macrogeometry and 3 implant-abutment connection designs.

MATERIALS AND METHODS: Eighty-four NDIs (3.5 × 10 mm) were selected and divided into 4 groups (n = 21/group) according to implant-abutment connection design, as follows: EH - external hexagon, IH - internal hexagon, IC - internal conical, and IC-M - internal conical connected to a monolithic titanium abutment. Identical abutments were torqued to the implants, and standardized maxillary incisor crowns were cemented and subjected to step-stress accelerated life testing (SSALT) in water. Use of level probability Weibull curves, and reliability for a mission of 50,000 cycles at 75 N and 200 N were calculated.

RESULTS: The beta (β) values were: 1.48 for IC, 1.40 for IC-M, 8.54 for EH, and 1.98 for IH, indicating that damage accumulation was an acceleration factor for failure of all groups. At 75 N the probability of survival was not significantly different between groups. A decrease in reliability was observed for all groups at 200 N with no significant differences between IC (81.71%) and IC-M (94.28%), or between EH and IH (0%) which presented the lowest values. EH failures were primarily restricted to the screw, while IH involved screw and implant fracture. IC and IC-M were restricted to prosthetic failures (fracture and bending).

CONCLUSIONS: Narrow implants with external or internal hexagon connections presented the lowest reliability at high loads compared to internal conical connections. Failure modes differed among connections.