Seongwook Choi, Sinyoung Park, Jiwoong Kim, Hyunhee Kim, Seonghee Cho, Sunam Kim, Jaeku Park, Chulhong Kim
The X-ray free-electron laser (XFEL) has remarkably advanced X-ray imaging technology and enabled important scientific achievements. The XFEL's extremely high power, short pulse width, low emittance, and high coherence make possible such diverse imaging techniques as absorption/emission spectroscopy, diffraction imaging, and scattering imaging. Here, we demonstrate a novel XFEL-based imaging modality that uses the X-ray induced acoustic (XA) effect, which we call X-ray free-electron laser induced acoustic microscopy (XFELAM)...
February 2024: Photoacoustics